Product introduction
Purpose:
It is suitable for sorting and testing of hardness, material and other items of steel balls, and realizes zero defect control of the whole batch of parts and components.
1．Hardness testing: The detection resolution is 1 to 2 HRC (other parameters are stable and consistent);
2．Material sorting: It can sort the mixture in heat treatment state.
Composition: The system consists of six parts: eddy current sorter, probe, feeder, mechanical device, electrical control and aluminium profile rack. The spherical parts arranged automatically by the hopper slide into the feeding path in turn. After detection by the eddy current probe, the workpiece is controlled by the sorting cylinder to enter the corresponding qualified or unqualified passage.
It is suitable for sorting and testing of hardness, material and other items of steel balls, and realizes zero defect control of the whole batch of parts and components.
1．Hardness testing: The detection resolution is 1 to 2 HRC (other parameters are stable and consistent);
2．Material sorting: It can sort the mixture in heat treatment state.
Composition: The system consists of six parts: eddy current sorter, probe, feeder, mechanical device, electrical control and aluminium profile rack. The spherical parts arranged automatically by the hopper slide into the feeding path in turn. After detection by the eddy current probe, the workpiece is controlled by the sorting cylinder to enter the corresponding qualified or unqualified passage.
Performance
|
Sorting speed |
Fifty hardness samples per minute; 100 hardness samples per minute for heat treatment and 100 hardness samples for non-heat treatment. |
|
Frequency range |
1Hz～1MHz |
|
Gain |
0～99dB，side size 0.1dB |
|
Phase rotation |
0~360° 1 ° |
|
Advanced filtering |
Yes |
|
Low pass |
1Hz～10000Hz |
|
High pass |
0.1Hz～650Hz |
| Synchronized alarm output controlled by internal and external clock |
| High Precision End and End Signal Excision Function |
| High Precision Real-time and Delayed Alarm Output |
| Fast Digital/Analog Electronic Balance |
| Delayed Hidden Removal Function with Memory Trajectory |
| Real-time impedance plane display |
| The instrument can match any probe |
| Remote Automatic Help System |
| Man-machine interface in Chinese and English |
|
Non-equal Amplitude Phase/Amplitude Alarm Domain |
